Keithley 2845 ACS Multi-Site Parallel Test AN free download

File name 2845 ACS Multi-Site Parallel Test AN.pdf

Number 2845 A Tektronix Company ACS Integrated Test System for Application Note Multi-Site Parallel Test Series Solution Concept System Architecture First, consider the device under test It is easiest to think of a multi-site (DUT). A DUT often includes a number tester as a system of mini testers. Each of elements that need to be tested. In a mini tester consists of all the resources sequential test regime, the testing of each needed to execute a suite of tests on a element, no matter how simple, adds single site. Figure 3 shows a system of to the overall test time. If two identical two mini testers. Each mini tester has elements can be tested in parallel, or several analog source-measure units even better, two identical and physically (SMUs), a test sequencer/controller, and an adjacent chips (as shown in Figure optional switch matrix. The independent 2) can be tested in parallel, the total controllers allow each mini tester to test throughput can be doubled. Not operate autonomously from the other only is the tester throughput doubled, mini testers and the system controller. the number of prober moves is cut in In this way, the system controller does half, resulting in significant test system not gate the execution of the testing, throughput improvement. but rather initiates test sequences and It is important to pay critical attention organizes the resulting test data. to the possible parasitic interactions Keithley's ACS integrated test systems between chips. For